Precision cutting of nanotubes with a low-energy electron beam
نویسندگان
چکیده
sReceived 16 September 2004; accepted 2 December 2004; published online 25 January 2005d We report on a method to locally remove material from carbon and boron nitride nanotubes using the low-energy focused electron beam of a scanning electron microscope. Using this method, clean precise cuts can be made into nanotubes, either part-way through screating hingelike geometriesd or fully through screating size-selected nanotube segmentsd. This cutting mechanism involves foreign molecular species and differs from electron-beam-induced knock-on damage in transmission electron microscopy. © 2005 American Institute of Physics. fDOI: 10.1063/1.1857081g
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